Kongunadu Research Journal
Vol. 4 No. 3 (2017): Vol 4, Iss 3, Year 2017
Articles

STRUCTURAL ANALYSIS OF ZINC OXIDE THIN FILMS PREPARED BY THERMAL EVAPORATION TECHNIQUE

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  • Balaganesh A.s,
  • Chandar Shekar B
Balaganesh A.s
Department of Physics, Kongunadu Arts and Science College, Coimbatore-641029, Tamil Nadu, India.
Chandar Shekar B
Zinc oxide thin films of 800nm were successfully prepared by thermal evaporation technique. XRD analysis revealed polycrystalline nature of the as prepared ZnO films. The structural parameters such as crystallite size, dislocation density and micro strain were evaluated and discussed.
DOI: https://doi.org/10.26524/krj224
Published December 30, 2017
Keywords
  • Structural analysis, Zinc oxide thin film, thermal evaporation technique.
How to Cite
A.s, B., & B, C. S. (2017). STRUCTURAL ANALYSIS OF ZINC OXIDE THIN FILMS PREPARED BY THERMAL EVAPORATION TECHNIQUE. Kongunadu Research Journal, 4(3), 7-9. https://doi.org/10.26524/krj224

Abstract

Zinc oxide thin films of 800nm were successfully prepared by thermal evaporation technique. XRD analysis revealed polycrystalline nature of the as prepared ZnO films. The structural parameters such as crystallite size, dislocation density and micro strain were evaluated and discussed.

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